SB2204/3(QS1B) Intelligent Dielectric Loss TesterDetailed product description：

The SB2204/3 intelligent dielectric loss tester is a novel automated instrument for measuring the dielectric loss tangent (tg δ) and capacitance value (Cx). It is possible to measure the dielectric loss tangent (tg δ) and capacitance value (Cx) of various insulation materials, insulation sleeves, power cables, capacitors, transformers, and other high-voltage equipment on site under high power frequency voltage. Compared with the Xilin capacitor bridge, it has the advantages of simple operation, automatic measurement, intuitive reading, no need for conversion, high accuracy, and strong anti-interference ability. The instrument is equipped with standard capacitors and voltage boosting devices, which can be used in an "internal" manner without the need for other external equipment, making it easy to carry. There are multiple measurement methods available, including positive/reverse wiring, internal/external standard capacitors, and internal/external test voltages for measurement. Positive wiring can measure high voltage dielectric loss. Equipped with SF6 standard capacitors, tgδ<0.005%， Less affected by air humidity, the vector operation method combined with phase shifting and inversion methods has good anti-interference effect; It can effectively eliminate the influence of strong electric field interference on measurement and is suitable for strong interference field tests in power stations below 500kV.

Main Features
When there is a high voltage short circuit or sudden power outage, the instrument can quickly cut off the high voltage and issue a warning message.
Good measurement repeatability and good voltage linearity (measurement accuracy is not affected by voltage).
Integrated structure, moderate weight, easy to carry.
Large screen with backlit Chinese LCD display for information prompt operation, easy to use.
The instrument comes with a printer to save test data in a timely manner.
Connect the high-voltage cable to the test sample to ensure safety; The instrument is not grounded and the alarm is triggered. The safety measures are complete.

Technical specifications of SB2204/3 (QS1B) intelligent dielectric loss tester
Rated working conditions: temperature 0-40 ℃, relative humidity 30% -85%, power supply 220V ± 22V 50 ± 1Hz
Dimensions: 440 × 330 × 400mm
Weight: not exceeding 23kg
Power consumption: not exceeding 40VA
Measurement range: dielectric loss (tg δ) 0-1 resolution 0.0001; Capacitance (Cx): Minimum resolution of 0.01pF
Internal connection method: Test voltage, sample capacitance 5kV 7.5kV 10kV 3pF~40000PF
1.5kV 2.25kV 3Kv 10pF～0.35μF
0.5kV 0.75kV 1kV 30pF～1.5μF
External connection method: The maximum test voltage for the "external booster" method is 10kV, while for the "external Cn" method (external high voltage, external standard capacitor), the maximum test voltage is determined by the standard capacitor and the test object (Umax=Imax/ω C)
The maximum current of the standard circuit is 50mA (In=U ω Cn), and the maximum current of the tested circuit is 2A (Ix=U ω Cx)
Internal booster output capability: rated output voltage, rated output current, 5kV, 7.5kV, 10kV, 100mA; 1.5kV 2.25kV 3kV 300mA； 0.5kV 0.75kV 1kV 500mA
Basic measurement error:

measurement content	Range of TG δ	Range of capacitance (Cx)	Sample type	Basic error
Media loss Consumption factor tgδ	0～0.5	50pF～60000pF	Non grounded	± (1% reading+0.0005)
			grounding	± (1% reading+0.0010)
		10pF~50pF or Above 60000pF	Non grounded	± (1% reading+0.0010)
			grounding	± (2% reading+0.002)
		3pF～10pF	Non grounded Regarding grounding
capacitance		Above 50pF		± (1% reading+1pF)
		Below 50pF		± (1% reading+2pF)

working principle
The measurement circuit of SB2204/3 (QS1B) intelligent dielectric loss tester includes a standard circuit and a test circuit. The standard circuit consists of a built-in high stability standard capacitor and a sampling circuit, while the test circuit consists of the test sample and the sampling circuit. The 8031 microcontroller uses computer digital real-time acquisition method to process tens of thousands of sampled data and perform vector operation. The amplitude and phase relationship of the standard circuit current and the tested circuit current are measured separately, and the capacitance value (Cx) and dielectric loss tangent (tg δ) of the test sample are calculated from them. The measurement results are reliable. When there is interference on site, first use phase shifting and inversion methods to reduce the impact of interference, and then add the measured current Ix 'of the tested circuit to the separately measured interference current Id vector to obtain the true measured current Ix, and then obtain the correct measurement result. As shown in Figure 3, multiple wiring methods can be flexibly adopted according to different measurement objects and measurement needs. When measuring non grounded test samples (positive connection method), the "LV" (E) point is grounded; When measuring the grounding test sample (reverse connection method), the "HV" point is grounded.