SB100A/2 Four probe metal/semiconductor resistivity measuring instrumentDetailed product description：

SB100A/2 is an improved version of the original SB100/1 and SB100A/1.

Due to the low resistance of metal block materials and metal thin films, their measurement adopts the four terminal wiring method. In order to meet practical needs, this instrument adopts the principle of four probe method to measure the resistance and resistivity of different metals, semiconductors, and conductive polymer materials. Can be used for physics education experiments in universities, testing and researching the resistance and resistivity of conductor/semiconductor/metal thin film materials. The resistance measurement range of this product can reach 10-6-106 Ω.

(Operating environment 5-40 ℃, relative humidity<80%, power supply 220V 50Hz, for laboratory environment use)

SB100A/2 consists of three parts: SB118 DC voltage and current source, PZ158A DC digital voltmeter, and SB120/2 four probe sample testing platform.
SB118 DC voltage and current source: It is a 4 1/2 bit voltage and current source that can output 5 µ V-50V, with 5 adjustable voltage levels and a basic error of ± (0.1% RD+0.02% FS). It can also output 1nA-100mA, with 5 adjustable current levels and a basic error of
± (0.03% RD+0.02% FS) Please refer to our company's product SB118 for details.
PZ158A DC digital voltmeter: a high-precision electronic measuring instrument with a word length of 6 half bits and a voltage resolution of 0.1 μ V, equipped with single-chip crisis processing technology, capable of measuring 0-1000V DC voltage. The basic error of the basic range is ± (0.002% RD+0.0005% FS), as detailed in our product PZ158A.
SB120/2 four probe sample testing platform: This testing platform is an improved version of the SB120/1 testing platform. It consists of a base, a bracket, a rotating component, a sample platform, four probes, and a wiring board. Due to significant improvements in its overall structure and rotation mode based on the original SB120/1, it has provided great convenience for the testing and research of the resistance and resistivity of conductor/semiconductor/metal thin film materials in physics experiments and scientific research in universities.