HomeYour location:Homeinstrumentation and metersElectrical instrumentsT_characteristic instrument → XJ4828 type digital storage analog device characteristic diagram instrument
Column tabs 
Product name: XJ4828 type digital storage analog device characteristic diagram instrument
specification: XJ4828 type digital storage analog device characteristic diagram instrument
  Zoom Zoom in on the image
Category: instrumentation and meters -- T_characteristic instrument
Column tabs 
Price: factory price
Brand: Shanghai
Place of Origin: China
Column tabs 
Available Quantity: batch
delivery cycle: Spot goods (or inquire by telephone)
tabs
  Shanghai Beiyuan Industry and Trade Co.,Ltd
+86-21-66770508
+86-13901609058

Email 91way@163.com
Wechat 13901609058(Wechat)


XJ4828 type digital storage analog device characteristic diagram instrumentDetailed product description:Column tabs
XJ4828 Analog Device Comprehensive Tester

Features:
Using color LCD display
Equipped with digital storage function
Capable of illustrating and measuring parameters of semiconductor transistor characteristics and three terminal voltage regulator integrated circuits
Capable of analyzing, selecting parameters, and matching analog devices
The semiconductor tube testing unit can meet the characteristic testing of DC parameters of diodes, transistors, field-effect transistors, VMOS and other devices.
The three terminal voltage regulator testing unit can test the static and load characteristic curves of the tested device
The linear integrated circuit testing unit has two testing modes: "manual" and "automatic".
Can conduct comprehensive testing on commonly used indicators of analog operational amplifiers and comparators, and intuitively display their maximum undistorted output amplitude.
Equipped with overload protection function, it can automatically protect the tested devices and testing instruments
Equipped with computer interface (USB)

Main technical specifications of XJ4828 digital storage analog device characteristic diagram instrument

Linear Integrated Circuit Testing
Misalignment voltage: 0-60mV error ± 5% read+2 words
Imbalance current: 0-10 μ A, error ± 5%, read+2 words
Input bias current: 0-10 μ A, error ± 5%, read+2 words
Differential mode open-loop gain: 60-99.9dB error ± 5% read+2 words
100-110dB error ± 7% read+2 words
Common mode rejection ratio: 60-99.9dB error ± 5% read+2 words
100-110dB error ± 7% read+2 words
Maximum output amplitude: ± 4V to ± 24V error ± 7% read+2 words
Static consumption current: 0-20mA error ± 5% read+2 words

Semiconductor tube testing
Collector voltage: 0.05V/div~50V/div with an error of ± 3%
Diode test voltage: 0-3000V (optional) with an error of ± 5%
Base voltage: 0.05V~1V/div error ± 3%
Collector current: 10 μ A~1A/div error ± 3%
Collector leakage current: 0.2 μ A~5 μ A/div error ± 3%~10%
Step voltage: 0.05V~1V/step error ± 3%
Step current: 0.2uA~50mA/Step error ± 5%~7%
△Ub : ±8V
Power consumption limiting resistor: 0-500K Ω with an error of ± 10%

General performance
Use power supply AC 220V/50Hz
Visual power of 80VA
Dimensions 300B × 360H × 530Dmm
Weight 19kg
XJ4828 type digital storage analog device characteristic diagram instrument
  • Related product tags  Related Products:
Product Category
All product information on this website is translated by Baidu machine translation, which may not be completely accurate and is only for reference