XJ4829 type digital storage semiconductor transistor characteristic diagram instrumentDetailed product description：

XJ4829 Digital Storage Semiconductor Tube Characteristics Diagram Instrument

Features:
Using color LCD display
Equipped with digital storage function
Capable of illustrating and measuring parameters of semiconductor transistor characteristics and three terminal voltage regulator integrated circuits
Capable of analyzing, selecting parameters, and matching analog devices
The semiconductor tube testing unit can meet the characteristic testing of DC parameters of diodes, transistors, field-effect transistors, VMOS and other devices.
Automatic measurement with β and gm values
With △ Ub: ± 8V
The maximum voltage for diode testing is 3000V
Equipped with overload protection function, it can automatically protect the tested devices and testing instruments
Equipped with computer interface (USB)

Main technical specifications of XJ4829 digital storage semiconductor transistor characteristic diagram instrument:

Collector voltage: 0.05V/div~50V/div with an error of ± 3%
Diode test voltage: 0-3000V with an error of ± 5%
Base voltage: 0.05V~1V/div error ± 3%
Collector current: 10 μ A~1A/div error ± 3%
Collector leakage current: 0.2 μ A~5 μ A/div error ± 3%~10%
IC and IR magnification: × 0.1
Step voltage: 0.05V~1V/step error ± 3%
Step current: 0.2uA~50mA/Step error ± 5%~7%
△Ub ： ±8V
Collector voltage range: 0-10V, 0-50V, 0-100V, 0-500V, continuously adjustable in each range
Power consumption limiting resistor: 0-500K Ω with an error of ± 10%

General performance indicators of XJ4829 digital storage semiconductor transistor characteristic diagram instrument

Use power supply AC 220V/50Hz
Visual power of 80VA
Dimensions 300B × 360H × 530Dmm
Weight 19kg