Shanghai Huabang Industrial Business Network - Material testing equipment

[Material testing equipment]SZT-2B Type Four Probe Tester

2026-6-17 14:37:41

SZT-2B Four Probe Tester
1. The host adopts advanced circuit design, and the measured values are more precise, faster, and accurate (the first generation is a traditional circuit, which has disadvantages such as large size, slow speed, and numerous components that affect the machine's lifespan).
2. The screen adopts LCD display (the first generation only had digital display).
3. Matching computer interfaces and software to make operation simple and clear (can be directly connected to a computer, the computer performs automatic calculations based on the specified thickness input, automatically compares and corrects coefficients, making the measured results more accurate, and the data can be stored or deleted, which is convenient for users to save records). This is an optional accessory.
The testing table on the SZT-2B testing rack is 100mm longer and wider than the traditional testing rack to meet the needs of testing large areas. It adopts an automatic sensing device that automatically decelerates when approaching the tested object, avoiding the wear of the tested object and probe (leading any similar product testing rack in the domestic market, the older generation is manual), and can also improve measurement accuracy.
5. When testing resistance, resistivity, and block resistance with this instrument, the standard coefficients are automatically adjusted by the machine itself, eliminating the need for manual adjustment and saving a lot of trouble with the original instrument.
The minimum resolution of this instrument is 0.1m ��
7. The host has an integrated manual and automatic function, and the testing rack can be completed manually and automatically without the need for two additional sets.
8. The test probe is a tungsten needle, which is commonly used in the market as a high-speed steel needle.
9. Each measurement has a built-in computer that automatically compensates for temperature and corrects voltage and current.
10. Measurement standard uncertainty of the whole machine: �� 2% (error of other domestic manufacturers is �� 5%)

Technical parameters of SZT-2B four probe tester: 1)
Measuring range:
Electrical resistivity: 10 ^ -4 ^ -10 ^ -6 ^ - �� - cm
Block resistance: 10 ^ -4 ^ -10 ^ -6 ^ - ��/��
Resistance: 10 ^ -4 ^ -10 ^ -6 ^ - ��
2) Measurable semiconductor material dimensions
Diameter: 5mm-250mm
Length: Any (requires a test probe)
3) Measurement method:
Both axial and cross-sectional directions are acceptable
4) Display mode: 41/2, digital display, polarity and overload automatic display, decimal point and unit automatic display.
5) Constant current source:
(1) Current output: DC current continuously adjustable from 0 to 100 mA.
(2) Range: 1, 10, 100 �� A, 1, 10, 100mA
(3) Error: ± 0.5% reading ± 1 word
6). Four probe testing probe
(1) Probe spacing: 1mm
(2) Material: Tungsten carbide Probe mechanical drift rate: ± 1.0%
7). Power supply: 220 ± 10% 50Hz or 60Hz Power consumption: �� 35W

[Material testing equipment]SZT-2C Four probe tester

2026-6-17 14:37:33

The SZT-2C four probe tester adopts advanced circuits for its main unit, resulting in more precise, faster, and accurate measurement values (the first generation is a traditional circuit, which has disadvantages such as large size, slow speed, and numerous components that affect the machine's lifespan).
2. The screen adopts a color LCD display (the first generation only had a digital display).
3. Matching computer interfaces and software to make operation simple and clear (can be directly connected to a computer, the computer performs automatic calculations based on the specified thickness input, automatically compares and corrects coefficients, making the measured results more accurate, and the data can be stored or deleted, which is convenient for users to save records). This is an optional accessory.
The testing table on the SZT-2C testing stand is 100mm longer and wider than the traditional testing stand, to meet the needs of testing large pieces (if customers have special requirements for the size of the testing machine, we can also customize according to their size). It adopts an automatic sensing device, which automatically decelerates when approaching the tested object, avoiding the loss of the tested object and the wear of the probe (leading any similar product testing stand in the domestic market, the older generation is manual), and can also improve the measurement accuracy.
5. When testing resistance, resistivity, and block resistance with this instrument, the standard coefficients are automatically adjusted by the machine itself, eliminating the need for manual adjustment and saving a lot of trouble with the original instrument. (The pressure of this instrument can be adjusted in three levels, and this function is an optional accessory)
The minimum resolution of this instrument is 0.1m ��
7. The host has an integrated manual and automatic function, and the testing rack can be completed manually and automatically without the need for two additional sets.
8. The test probe is a tungsten needle, which is commonly used in the market as a high-speed steel needle.
9. Each measurement has a built-in computer that automatically compensates for temperature and corrects voltage and current.
10. Measurement standard uncertainty of the whole machine: �� 2% (error of other domestic manufacturers is �� 5%)

Technical parameters of SZT-2C four probe tester:
1) Measurement range:
Electrical resistivity: 10-5-105 ��. cm
Block resistance: 10 ^ -4 ^ -10 ^ -6 ^ - ��/��
Resistance: 10-5-105 ��;
·2) Measurable semiconductor material dimensions
Diameter: 5mm-250mm
Length: Any (requires a test probe)
·3) Measurement method:
Both axial and cross-sectional directions are acceptable
4) Display mode: 41/2, digital display, polarity and overload automatic display, decimal point and unit automatic display.
5) Constant current source:
(1) Current output: DC current continuously adjustable from 0 to 100 mA. The range and representation of the continuously adjustable digital voltmeter for each current range are 000.00 to 199.99 mV;
(2) Range: 1, 10, 100 �� A, 1, 10, 100mA
(3) Error: ± 0.5% reading ± 1 word
(4) Resolution: 10 �� V; Input impedance>1000M ��; accuracy: ± 0.1%;
6). Four probe testing probe
(1) Probe spacing: 1 ± 0.01mm;
(2) Material: Tungsten carbide Probe mechanical drift rate: �� 0.3%;
(3) Probe pressure: 5-16 Newtons (total force);
7) The maximum relative error of the whole machine measurement (tested with silicon standard sample: 0.01-180 ��· cm) is ��± 5%
8) Power supply: 220 ± 10% 50Hz or 60Hz Power consumption: �� 35W
9) Computer communication interface: parallel port, high-speed parallel data acquisition. When connected to a computer for use, it only takes 1.5 seconds to collect data to the computer (in the range of 0.1mA, 1mA, 10mA, and 100mA). Connect to the computer and use the automatic measurement function to automatically select the appropriate current range for sample testing.

[Material testing equipment]SZT-1 Digital Four Point Probe Tester

2026-6-17 14:37:25

The SZT-1 digital four probe tester is a multi-purpose comprehensive measurement device that uses the four probe measurement principle. It can measure the radial and axial resistivity of sheet and fast semiconductor materials, measure the resistivity of sheet semiconductor materials and the sheet resistance (square resistance) of diffusion layers. With a specially designed four probe test clip, it can also measure the low median resistance of metal conductors. In addition, after special processing, the probe can also measure the resistivity of thin film materials. Widely applicable to semiconductor materials, device factories, chemical physics departments of higher education institutions, and research units, for testing the resistance performance of semiconductor materials.
The testing probe of this instrument adopts a gemstone guide shaft sleeve and a high wear-resistant tungsten carbide probe, with accurate positioning, low drift rate, and long service life.

Technical parameters of SZT-1 digital four probe tester:
1. Measurement range:
Electrical resistivity: 10 ^ -4 ^ -10 ^ -3 ^ - �� - cm
Block resistance: 10 ^ -3 ^ -10 ^ -4 ^ ��/��
Resistance: 10 ^ -6 ^ -10 ^ -5 ^ - ��
Conductivity type identification: resistivity range of 10 ^ -4 ^ -10 ^ -3 ^ - �� - cm
2. Measurable semiconductor material dimensions
Diameter: 15~100 mm
Length: �� 400mm
3. Measurement method:
Both axial and cross-sectional directions are acceptable
4. Display mode: 31/2, digital display, polarity and overload automatic display, decimal point and unit automatic display.
5. Constant current source:
(1) Current output: DC current continuously adjustable from 0 to 100 mA.
(2) Range: 10, 100 �� A, 1, 10, 100mA
(3) Error: ± 0.5% reading ± 2 words
6. Four probe testing probe
(1) Probe spacing: 1mm
(2) Material: Tungsten carbide Probe mechanical drift rate: ± 1.0%
7. Power supply: 220 ± 10% 50Hz or 60Hz Power consumption: �� 35W

[Material testing equipment]M-2 digital resistivity tester

2026-6-17 14:37:16

The M-2 digital resistivity tester is a multi-purpose comprehensive measuring device that uses the four probe measurement principle. It can measure the radial and axial resistivity of sheet and block semiconductor materials, as well as measure the sheet resistance (also known as block resistance) of the diffusion layer. By using a specially designed four probe testing fixture, it is also possible to measure the low and median resistance of metal conductors.
The instrument consists of a host, a test probe (optional test bench), and other parts, and the test results are directly displayed using a digital meter head. The host is mainly composed of a CNC constant current source, high-resolution ADC, embedded microcontroller system, and automatic range conversion. The test probe is made of highly wear-resistant tungsten carbide probe, which has accurate positioning, low drift rate, and long service life.
The instrument is suitable for testing the resistance performance of semiconductor materials in semiconductor material factories, semiconductor device factories, research institutions, and universities. Especially suitable for situations that require rapid measurement of low to medium resistivity
The working conditions of this instrument are:
temperature
Relative humidity: 60%~70%
There should be no strong electromagnetic field interference in the studio, and power should not be shared with high-frequency equipment

Technical parameters of M-2 digital resistivity tester
1. Measurement range:
Electrical resistivity: 10-2~102 �� - cm
Block resistance: 10-1~103 ��/��
Resistance: 10-3~9999 ��
2. Measurable semiconductor material dimensions
Diameter: 15mm-100mm
Length (or height): �� 400mm
3. Measurement direction:
Both axial and radial directions are acceptable
4. Digital voltmeter
Range: 2V
Error: ± 0.1% FSB ± 2LSB
Maximum resolution: 10 �� A
Accuracy: 18 bit ADC (5 1/2 bits)
Display: 4-digit display, decimal point automatically displayed
5. CNC constant current source
Current output: DC current 2 �� A~2mA, 2 �� A step adjustable, system automatically adjusts.
Error: ± 0.1% FSB ± 0.5LSB
6. Four probe test probe:
Probe spacing: 1mm
Probe mechanical drift rate: ± 1%
Probe: Tungsten carbide, diameter 0.5mm
7. Power supply:
DC 4.5V ~8V
Power consumption:<1W
Power adapter: Input: 220V ± 10% 50Hz
Output: DC5V ± 10%
8. External dimensions:
Host: 170mm (length) X 130mm (width) X50mm (height)

[Material testing equipment]SZT-5 Type Material Composite Tester

2026-6-17 14:37:08

1�� Overview;
The SZT-5 material composite tester is composed of two types of silicon material testing instruments combined
1. A two range resistance measuring instrument, equipped with a handheld four pin test head or a seated test stand, can be used to measure sheet, column, or block resistivity
Semiconductor materials within the range of 0.01 to 200 ohms per centimeter. By adjusting the constant current source, certain measurement results can be adjusted. For example, the test results of ordinary silicon materials need to be multiplied by an exploration head correction factor of 0.628, and the correction factor for thin layer diffusion and conductive film "block resistance" of silicon materials is 4.53. All of these can be processed by adjusting the constant current.
The SZT-4 digital four probe tester is compact in size, easy to operate, and has a moderate range, making it very suitable for sorting recycled materials.
2. The rectification method silicon material P-N polarity discriminator is equipped with a three pin handheld probe, which can detect sheet or block resistivity ranging from 1000-0.01 ohms/cm. Polarity discrimination of silicon materials
The working environment conditions of this instrument are:
Temperature: 18 �� -25 ��
Relative humidity: 50% -70%
There should be no strong electric field interference in the studio, and power should not be shared with high-frequency equipment.

2�� Technical parameters of SZT-5 material composite tester
1. Measurement range
(1) Electrical resistivity measurement:
Resistance 0.01-200 �� - cm
Block resistance 0.01-200 �� - port
Resistance 0.01-200.0 ��
2. Digital voltmeter
(1) Range: 200mV single range
(2) Error: Reading ± 0.2% ± 3 words
(3) Input resistance:>10M ��
3. Constant current source
(1) Current output: 0~10mA continuously adjustable
(2) Range: 1mA, 10mA
(3) Error: ± 0.2% ± 3 words,
4. Handheld four probe test head
(a) Probe spacing: 1mm
(b) Probe mechanical drift rate: ± 1.0%
(c) Probe material: tungsten carbide, ��0.
(d) Pressure: Maximum 2Kg
(2) Conductivity type discrimination:
It can be used to determine the conductivity type of silicon materials with a resistivity of 1000-0.01 ohms/cm, and can also indicate through sound and light alarms that the tested material belongs to "heavy doping".

[Material testing equipment]SZT-2A Semiconductor material four probe tester

2026-6-17 14:37:00

SZT-2A semiconductor material four probe tester

The host adopts advanced circuit design, and the measured values are more precise, faster, and accurate (the first generation is a traditional circuit, which has disadvantages such as large size, slow speed, and numerous components that affect the machine's lifespan).
2. The screen adopts LCD display (the first generation only has digital tube display), and is integrated with manual (automatic is standard, manual handheld is optional).
3. Matching computer interfaces and software (with 232 interface and USB interface), making operation simple and clear (can be directly connected to a computer, the computer can automatically calculate, compare and correct coefficients according to the specified thickness input, making the measured results more accurate, data can be stored or deleted, which is convenient for users to save records). This function is an optional accessory.
4. The second-generation test stand adopts an automatic sensing device, which automatically decelerates when approaching the tested object, avoiding the wear and tear of the tested object and probe (leading any similar product test stand in the domestic market, the older generation was manual).
When testing resistance, resistivity, and block resistance with this instrument, the standard coefficients are automatically calculated with the selection key, eliminating the need for manual adjustment and saving a lot of trouble with the original instrument.
The maximum resolution of the SZT-2A semiconductor material four probe tester is 0.1m ��.
7. The test probe is a tungsten needle, which is commonly used in the market as a high-speed steel needle.
8. Each measurement has a built-in computer that automatically compensates for temperature and corrects voltage and current.
9. Measurement standard uncertainty of the whole machine: �� 2% (error of other domestic manufacturers is �� 5%)

10. Technical parameters of SZT-2A semiconductor material four probe tester:
1) Measurement range:
Electrical resistivity: 10 ^ -4 ^ -10 ^ -5 ^ - �� - cm
Block resistance: 10 ^ -4 ^ -10 ^ -5 ^ ��/��
Resistance: 10 ^ -4 to 10 ^ -5 ��
2) Measurable semiconductor material dimensions
Diameter: 5mm-130mm
Length: �� 400mm
If a handheld probe is used, the size range can be extended
3) Measurement method:
Both axial and cross-sectional directions are acceptable
4) Display mode: 41/2, digital display, polarity and overload automatic display, decimal point and unit automatic display.
5) Constant current source:
(1) Current output: DC current 0~100 mA
(2) Range: 10, 100 �� A, 1, 10, 100mA
(3) Error: ± 0.5% reading ± 1 word
6). Four probe testing probe
(1) Probe spacing: 1mm
(2) Material: Tungsten carbide Probe mechanical drift rate: ± 1.0%
7). Power supply: 220 ± 10% 50Hz or 60Hz Power consumption: �� 35W

Both axial and cross-sectional directions are acceptable
4) Display mode: 41/2, digital display, polarity and overload automatic display, decimal point and unit automatic display.
5) Constant current source:
(1) Current output: DC current 0~100 mA
(2) Range: 10, 100 �� A, 1, 10, 100mA
(3) Error: ± 0.5% reading ± 1 word

6). Four probe testing probe
(1) Probe spacing: 1mm
(2) Material: Tungsten carbide Probe mechanical drift rate: ± 1.0%
7). Power supply: 220 ± 10% 50Hz or 60Hz Power consumption: �� 35W