SB100A/3 type four probe conductor/semiconductor resistivity measuring instrumentDetailed product description：

SB100A/3 type four probe conductor/semiconductor resistivity measuring instrument
Due to the low resistance of metal block materials and metal thin films, their measurement adopts the four terminal wiring method. In order to meet practical needs, this instrument adopts the principle of four probe method to measure the resistance and resistivity of different metals, semiconductors, and conductive polymer materials. Can be used for physics education experiments in universities, testing and researching the resistance and resistivity of conductor/semiconductor/metal thin film materials. The resistance measurement range of this product can reach 10-6-106 Ω.

The SB100A/3 four probe conductor/semiconductor resistivity measuring instrument consists of two instruments: the SB118/1 precision voltage and current source and the SB120/2 four probe sample platform.
SB118 precision DC voltage and current source (see product manual for details)
DC current source
a) Current output range: 1nA~200mA, output voltage not less than 5V;
b) Range: divided into five levels, 20 μ A, 200 μ A, 2mA, 20mA, 200mA;
c) Basic error of current output: 0.03% RD ± 0.02% FS (20 ± 2 ℃); Among them, 50-200mA is 0.05% RD ± 0.02% FS.
DC voltage source
a) Voltage output range: 5 μ V~50V, load current not less than 10mA (above 20mV);
b) Range: divided into five levels, 20mV, 200mV, 2V, 20V, 50V, with coarse and fine adjustments for each level;
c) The basic error of voltage output is 0.05% RD ± 0.02% FS (20 ± 2 ℃).
The digital voltmeter (4 half LED) uses the "sampling" terminal of the voltage source to test the measured voltage
a) Measurement range: 20mV, 200mV, 2V, 20V, 200V
b) The highest resolution can reach 1 µ V
c) The basic error is 0.03% RD ± 0.02% FS (20 ± 2 º C)
SB120/2 four probe sample platform (see product manual for details)
It provides convenience to measure the resistance and resistivity of conductor/semiconductor samples using the four probe measurement method for the tested thin film samples.