SXJS-IV Intelligent Dielectric Loss TesterDetailed product description：

The SXJS-IV intelligent dielectric loss tester is an advanced instrument for measuring dielectric loss (tg δ) and capacitance capacity (Cx). It is used to measure the dielectric loss (tg δ) and capacitance capacity (Cx) of various insulation materials, insulation sleeves, power cables, capacitors, transformers, and other high-voltage equipment under power frequency high voltage. It eliminates the QSI high-voltage bridge and has the advantages of simple operation, Chinese display, printing, convenient use, no conversion required, built-in high voltage, strong anti-interference ability, and short testing time. It is our factory's third-generation intelligent dielectric loss tester.

working principle
The instrument measurement circuit includes a standard circuit and a test circuit. The standard circuit consists of a built-in high-voltage stability standard capacitor and a standard resistor network. The computer collects the current amplitude and phase difference of the standard circuit and the test circuit in real time, and calculates the capacitance value (CX) and dielectric loss (tg δ) of the tested object.
All data acquisition circuits use high-voltage stabilizing devices, and the acquisition board and acquisition computer are completely suspended and shielded by iron boxes. The instrument casing is grounded and shielded; In addition, anti-interference technologies such as optical data, floating ground, large-area ground, single point ground, and digital filtering were used. In addition, the computer processed data from hundreds of power grid cycles, making the measurement results stable, accurate, and reliable.

Technical specifications of SXJS-IV intelligent dielectric loss tester

1. Environment: -5 ℃~40 ℃ (LCD screen should avoid prolonged sunlight exposure)
2. Relative humidity: 30% to 70%
3. Power supply: Voltage: 220V ± 10%, Frequency: 50 ± 1Hz
4. Dimensions: Length * Width * Height=500mm * 300mm * 400mm
5. Weight: 18kg
6. Output power: 1.5KVA
7. Display resolution: 3 bits, 4 bits (all internal are 6 bits)
8. Testing methods: forward connection method, reverse connection method, external test voltage method
9. Measurement range: Internal test voltage: ≤ 60000PF (10KV voltage greater than 30000PF) External test voltage: determined by the output power of the external test transformer
10. Basic measurement error: dielectric loss (tg δ): 1% ± 0.04%, capacitance (Cx): 1% ± 1pF