XJ4810,XJ4810A type semiconductor transistor characteristic diagram instrumentDetailed product description：

The XJ4810 and XJ4810A semiconductor transistor characteristic graphing instruments use oscilloscope tubes to display various characteristic curves of semiconductor devices and measure their static parameters. This instrument has a two cluster curve display and a bidirectional collector scanning circuit, which can compare and analyze the characteristics of the tested semiconductor device, making it easy to pair tubes or accessories.

The XJ4810 and XJ4810A semiconductor transistor characteristic diagram instrument has an IR measurement of 200nA/div, and with an expansion device, the VC can reach 3KV. It can test the transmission characteristics of CMOS and TTL gate circuits; Can pair or test field-effect transistors; Can test the characteristics of a three terminal voltage regulator.

Collector scanning signal
Output voltage range and current capacity
0～5V10A（XJ4810A）0～10V5A
0～50V1A0～100V0.5A
0～500V0.1A
Base step signal
Step current ranging from 0.2 μ A/step to 50mA/step, divided into 17 levels (XJ4810)
0.2 μ A/level to 100mA/level, divided into 18 levels (XJ4810A)
Step voltage range of 0.05V to 1V/step, divided into 5 levels (XJ4810)
0.1V~2V/level, divided into 5 levels (XJ4810A)
Y-axis deflection coefficient
Collector current 10 μ A/div~0.5A/div, divided into 15 levels (XJ4810)
10μA/div～1A/div， Divided into 16 levels (XJ4810A)
Diode current ranging from 0.2 μ A/div to 5 μ A/div, divided into 5 levels
Magnification x 0.1
X-axis deflection coefficient
Collector voltage 0.05V/div~50V/div, divided into 10 levels
0.05V/div～1V/div， Divided into 5 levels
Two ethnic display
Two cluster curves are displayed separately on both sides and can be displaced left and right
General performance
Adapt to power supply AC220V ± 10% 50Hz ± 4%
Apparent power of approximately 50VA (non test state)
Approximately 80VA (maximum power)
Dimensions 320B × 220H × 400Dmm
Weight 17kg