XJ4812 type semiconductor transistor characteristic diagram instrumentDetailed product description：

The XJ4812 semiconductor transistor characteristic diagram instrument is a new generation portable diagram instrument used to measure various semiconductor transistor characteristic curves and static parameters. The whole machine adopts innovative circuit design technology, with the characteristics of lightweight appearance, easy operation, stable and reliable performance, and high cost-effectiveness, which can meet the testing requirements of most semiconductor devices.

The XJ4812 semiconductor transistor characteristic diagram instrument is suitable for use in factory production lines, college teaching experiments, and electronic equipment maintenance fields.

Collector scanning signal
Output voltage range and current capacity 0-50V 2A,
0～500V 50mA， Positive and negative continuously adjustable
Power consumption limiting resistor 0~100K Ω continuously adjustable
Capacitive current ≤ 1 μ A (at 500V)
Base step signal
Step current 5 μ A/level~10mA/level
Step voltage range of 0.05V to 0.5V per level
Each cluster level is 0-10
Series resistance 0, 10K Ω
Y-axis deflection coefficient
Collector current 10 μ A/div~0.2A/div
Magnification x 0.1 1 μ A/div
X-axis deflection coefficient
Collector current 0.05V/div~50V/div
Base voltage 0.05V/div~0.5V/div
General performance
Use power supply AC220V/50Hz
The apparent power is about 80VA
Dimensions 330B × 140H × 400Dmm
Weight 9.5kg