YB3117/YB3118 Online and Offline Digital Integrated Circuit Tester
Test pin count of 100;
Chinese Windows operating platform;
Open self built chips and databases.
| Project/Model |
Can test TTL, CMOS, GAL, RAM, EPROM, CPU, and programmable devices |
| Test type |
Graphic display (timing display), status display |
| display mode |
Less than 100 feet |
| Number of pins on the tested chip |
100mA per pin |
| Output current |
500kHz/Pin |
| test speed |
|
| Chinese Windows operating platform |
|
| Open self built chips and databases |
|
| V-l characteristic curve test |
|
| Operating Temperature |
10℃-30℃ |
| Operating Humidity |
75% |
| power consumption |
Approximately 45W (excluding power consumption for the side panel) |
| working voltage |
220V±10% |
| Overall dimensions |
90H×350W×350D(mm) |
| quality |
About 4.7kg |
| Remark |
YB3117 with desktop computer, YB3118 with laptop computer |
YB3117/YB3118 Online and Offline Digital Integrated Circuit Tester